Simulation and measurement of the Guided Microwave Spectrometry system.

dc.contributor.advisorJean, B. Randall.
dc.contributor.authorDaniliuc, Joshua D.
dc.contributor.departmentElectrical and Computer Engineering.en_US
dc.contributor.schoolsBaylor University. Dept. of Electrical and Computer Engineering.en_US
dc.date.accessioned2013-09-24T14:14:43Z
dc.date.available2013-09-24T14:14:43Z
dc.date.copyright2013-08
dc.date.issued2013-09-24
dc.description.abstractPreviously, a novel microwave measurement device known as the Guided Microwave Spectrometry (GMS) system was developed for retrieving properties of material under test (MUT) and non-destructively measuring the composition of various mixtures of known constituents. In this work, simulation and measurement studies on this GMS technology are presented to investigate how electromagnetic waves propagate in the structure. I will explain the wave propagation characteristics and how each individual component of the GMS contributes to the overall system response. The GMS system responses to both homogeneous and inhomogeneous materials inside the chamber are examined as well. Finally, I present ways to enhance GMS system performance by carrying out comprehensive parametric studies on both rectangular and circular GMS systems.en_US
dc.description.degreeM.S.E.C.E.en_US
dc.identifier.urihttp://hdl.handle.net/2104/8823
dc.language.isoen_USen_US
dc.publisheren
dc.rightsBaylor University theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. Contact librarywebmaster@baylor.edu for inquiries about permission.en_US
dc.rights.accessrightsWorldwide access.en_US
dc.rights.accessrightsAccess changed 1/28/16.
dc.subjectWaveguide.en_US
dc.subjectPassband.en_US
dc.subjectMicrowave spectrometry.en_US
dc.subjectCutoff frequency.en_US
dc.subjectPermittivity.en_US
dc.subjectDielectric constant.en_US
dc.titleSimulation and measurement of the Guided Microwave Spectrometry system.en_US
dc.typeThesisen_US
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